Characterization of a hard X-ray telescope at synchrotron facility SPring-8

Yasushi Ogasaka, Keisuke Tamura, Ryo Shibata, Akihiro Furuzawa, Takuya Miyazawa, Kenta Shimoda, Yoshihiro Fukaya, Tomonaga Iwahara, Tomokazu Nakamura, Masataka Naitou, Yasufumi Kanou, Naoki Sasaki, Daisuke Ueno, Takashi Okajima, Emi Mlyata, Noriaki Tawa, Kenji Mukai, Kazuhiro Ikegami, Michihiko Aono, Kentaro UesugiYoshio Suzuki, Satoshi Takeuchi, Taku Futamura, Rika Takahashi, Machiko Sakashita, Chiaki Sakai, Masayuki Nonoyama, Nobuaki Yamada, Katsuhiko Onishi, Tomofumi Miyauchi, Yoshitomo Maeda, Shunsaku Okada, Peter Serlemitsos, Yang Soong, Kai Wing Chan, Scott Rohrbach, Fred Berendse, Jack Tueller, Hiroshi Tsunemi, Hideyo Kunieda, Koujun Yamashita

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Abstract

Space-borne astronomical instruments require extensive characterization on the ground before launch. In the hard X-ray region however, it is difficult for a laboratory-based beamline using a conventional X-ray source to provide a capability sufficient for pre-flight high-precision calibration. In this paper, we describe an experiment to characterize a hard X-ray telescope at a synchrotron facility, mainly on the basis of experimental setup and examples of measured results. We have developed hard X-ray telescopes consisting of Wolter-I grazing incidence optics and platinum-carbon multilayer supermirror coatings. The telescopes have been characterized at the synchrotron facility SPring-8 beamline BL20B2. The measurements at BL20B2 have great advantages such as extremely high flux, large-sized and less-divergent beam, and monochromatic beam covering the entire hard X-ray region from 8 to over 100keV. The telescope was illuminated by monochromatic hard X-rays, and the focused image was measured by high resolution hard X-ray imagers. The entire telescope aperture was mapped by a small beam, and the effective area and the point spread function were obtained as well as local optical properties for further diagnostics of the characteristics of the telescope.

Original languageEnglish
Pages (from-to)5743-5754
Number of pages12
JournalJapanese Journal of Applied Physics
Volume47
Issue number7 PART 1
DOIs
Publication statusPublished - 11-07-2008
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Ogasaka, Y., Tamura, K., Shibata, R., Furuzawa, A., Miyazawa, T., Shimoda, K., Fukaya, Y., Iwahara, T., Nakamura, T., Naitou, M., Kanou, Y., Sasaki, N., Ueno, D., Okajima, T., Mlyata, E., Tawa, N., Mukai, K., Ikegami, K., Aono, M., ... Yamashita, K. (2008). Characterization of a hard X-ray telescope at synchrotron facility SPring-8. Japanese Journal of Applied Physics, 47(7 PART 1), 5743-5754. https://doi.org/10.1143/JJAP.47.5743