Development of high-speed X-ray CT inspection system using X-ray line sensor

Daisuke Suzuki, Kenji Noguchi, Takayuki Murakoshi, Atsushi Teramoto

Research output: Contribution to conferencePaper

Abstract

The recent progress in surface mount technology has highlighted an urgent demand for a higher performance level of inspection technology. X-ray inspection is one of the most suitable systems for substituting the conventional automated optical inspection system. In particular, X-ray computed tomography (CT) inspection provides precise inspection as it can obtain three-dimensional data and can distinguish the features on the top side of a double-sided printed circuit board (PCB) from those on the bottom side. However, X-ray inspection systems are not in common use in the surface mount production line due to their complex image capturing mechanism, which requires a longer inspection time. Taking this limitation into consideration, we developed a simple mechanism utilizing an X-ray line sensor to obtain CT images of a wide area at a faster rate. We term this system as linear CT. In this paper, we explain the image capturing mechanism of linear CT and report that this mechanism can generate cross-sectional images of sufficiently high quality for precise inspection.

Original languageEnglish
DOIs
Publication statusPublished - 01-01-2013
Event2013 3rd IEEE CPMT Symposium Japan, ICSJ 2013 - Kyoto, Japan
Duration: 11-11-201313-11-2013

Other

Other2013 3rd IEEE CPMT Symposium Japan, ICSJ 2013
CountryJapan
CityKyoto
Period11-11-1313-11-13

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Tomography
Inspection
X rays
Sensors
Surface mount technology
Printed circuit boards

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Suzuki, D., Noguchi, K., Murakoshi, T., & Teramoto, A. (2013). Development of high-speed X-ray CT inspection system using X-ray line sensor. Paper presented at 2013 3rd IEEE CPMT Symposium Japan, ICSJ 2013, Kyoto, Japan. https://doi.org/10.1109/ICSJ.2013.6756131
Suzuki, Daisuke ; Noguchi, Kenji ; Murakoshi, Takayuki ; Teramoto, Atsushi. / Development of high-speed X-ray CT inspection system using X-ray line sensor. Paper presented at 2013 3rd IEEE CPMT Symposium Japan, ICSJ 2013, Kyoto, Japan.
@conference{73644022659441849259175a5c1b2256,
title = "Development of high-speed X-ray CT inspection system using X-ray line sensor",
abstract = "The recent progress in surface mount technology has highlighted an urgent demand for a higher performance level of inspection technology. X-ray inspection is one of the most suitable systems for substituting the conventional automated optical inspection system. In particular, X-ray computed tomography (CT) inspection provides precise inspection as it can obtain three-dimensional data and can distinguish the features on the top side of a double-sided printed circuit board (PCB) from those on the bottom side. However, X-ray inspection systems are not in common use in the surface mount production line due to their complex image capturing mechanism, which requires a longer inspection time. Taking this limitation into consideration, we developed a simple mechanism utilizing an X-ray line sensor to obtain CT images of a wide area at a faster rate. We term this system as linear CT. In this paper, we explain the image capturing mechanism of linear CT and report that this mechanism can generate cross-sectional images of sufficiently high quality for precise inspection.",
author = "Daisuke Suzuki and Kenji Noguchi and Takayuki Murakoshi and Atsushi Teramoto",
year = "2013",
month = "1",
day = "1",
doi = "10.1109/ICSJ.2013.6756131",
language = "English",
note = "2013 3rd IEEE CPMT Symposium Japan, ICSJ 2013 ; Conference date: 11-11-2013 Through 13-11-2013",

}

Suzuki, D, Noguchi, K, Murakoshi, T & Teramoto, A 2013, 'Development of high-speed X-ray CT inspection system using X-ray line sensor' Paper presented at 2013 3rd IEEE CPMT Symposium Japan, ICSJ 2013, Kyoto, Japan, 11-11-13 - 13-11-13, . https://doi.org/10.1109/ICSJ.2013.6756131

Development of high-speed X-ray CT inspection system using X-ray line sensor. / Suzuki, Daisuke; Noguchi, Kenji; Murakoshi, Takayuki; Teramoto, Atsushi.

2013. Paper presented at 2013 3rd IEEE CPMT Symposium Japan, ICSJ 2013, Kyoto, Japan.

Research output: Contribution to conferencePaper

TY - CONF

T1 - Development of high-speed X-ray CT inspection system using X-ray line sensor

AU - Suzuki, Daisuke

AU - Noguchi, Kenji

AU - Murakoshi, Takayuki

AU - Teramoto, Atsushi

PY - 2013/1/1

Y1 - 2013/1/1

N2 - The recent progress in surface mount technology has highlighted an urgent demand for a higher performance level of inspection technology. X-ray inspection is one of the most suitable systems for substituting the conventional automated optical inspection system. In particular, X-ray computed tomography (CT) inspection provides precise inspection as it can obtain three-dimensional data and can distinguish the features on the top side of a double-sided printed circuit board (PCB) from those on the bottom side. However, X-ray inspection systems are not in common use in the surface mount production line due to their complex image capturing mechanism, which requires a longer inspection time. Taking this limitation into consideration, we developed a simple mechanism utilizing an X-ray line sensor to obtain CT images of a wide area at a faster rate. We term this system as linear CT. In this paper, we explain the image capturing mechanism of linear CT and report that this mechanism can generate cross-sectional images of sufficiently high quality for precise inspection.

AB - The recent progress in surface mount technology has highlighted an urgent demand for a higher performance level of inspection technology. X-ray inspection is one of the most suitable systems for substituting the conventional automated optical inspection system. In particular, X-ray computed tomography (CT) inspection provides precise inspection as it can obtain three-dimensional data and can distinguish the features on the top side of a double-sided printed circuit board (PCB) from those on the bottom side. However, X-ray inspection systems are not in common use in the surface mount production line due to their complex image capturing mechanism, which requires a longer inspection time. Taking this limitation into consideration, we developed a simple mechanism utilizing an X-ray line sensor to obtain CT images of a wide area at a faster rate. We term this system as linear CT. In this paper, we explain the image capturing mechanism of linear CT and report that this mechanism can generate cross-sectional images of sufficiently high quality for precise inspection.

UR - http://www.scopus.com/inward/record.url?scp=84897531206&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84897531206&partnerID=8YFLogxK

U2 - 10.1109/ICSJ.2013.6756131

DO - 10.1109/ICSJ.2013.6756131

M3 - Paper

AN - SCOPUS:84897531206

ER -

Suzuki D, Noguchi K, Murakoshi T, Teramoto A. Development of high-speed X-ray CT inspection system using X-ray line sensor. 2013. Paper presented at 2013 3rd IEEE CPMT Symposium Japan, ICSJ 2013, Kyoto, Japan. https://doi.org/10.1109/ICSJ.2013.6756131