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Excimer laser etching process of CdTe crystals for formation of deep vertical trenches

  • K. Yasuda
  • , M. Niraula
  • , K. Nakamura
  • , M. Yokota
  • , I. Shingu
  • , K. Noda
  • , Y. Agata
  • , K. Abe
  • , O. Eryu

Research output: Contribution to journalArticlepeer-review

Abstract

Deep isolation trenches with high aspect ratio were formed on CdTe crystals using the excimer laser etching technique. Vertical trenches 80-μm deep and 55-μm wide were formed in 5 min by irradiating a laser on the CdTe crystal through a contact-type metal mask in vacuum. Surface chemistry of the laser-irradiated CdTe crystal was examined by Auger electron spectroscopy (AES), scanning electron microscopy (SEM), and photoluminescence (PL) to determine the extent of laser-induced damage. It was found that the damaged layer remains confined to the thin surface layer in the submicron range, which could be easily removed by a light Br-methanol etch.

Original languageEnglish
Pages (from-to)837-840
Number of pages4
JournalJournal of Electronic Materials
Volume36
Issue number8
DOIs
Publication statusPublished - 08-2007
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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