Measurement of re ectivity of X-ray mirror for soft x-ray telescope onboard ASTRO-H

Satoshi Sugita, Akihiro Furuzawa, Kazunori Ishibashi, Keisuke Tamura, Takashi Okajima, Yoshitomo Maeda, Takuro Sato, Kou Ichihara, Kazuki Tomikawa, Ryo Iizuka, Takashi Awaya, Kohta Okada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

X-ray reflection mirror of the Soft X-ray Telescope onboard ASTRO-H was coated by gold thin layer. Gold have M-shell X-ray absorption edge around 2 keV which is included in the energy band covered with the focal plane detector such as Soft X-ray Imager and Soft X-ray Spectrometer. It is important to make response function taken int account the Au M-dege structure especially for the Soft X-ray Spectrometer because It has unprecedented high energy resolution of 5 eV from 0.3 to 12 keV. We performed the detailed measurements of of reflectivity of the mirror using reflectometer in the synchrotron radiation facility KEK PF BL-11B from Nov. 29, 2011 to Dec. 5. X-ray beam of BL-11B was monochromatized to E/deltaE of 5000 by Double crystal monochromator using Si(111). We obtained the reflectivity at the grazing incident angles of 1.0, 1.2, and 1.4 degrees. While the energy pitch was set to be 2 eV in the 2.1-4.1 keV band, the reflectivity in the 2.2-2.35 keV band was also measured in detail with the energy pitch of 0.25 eV. We report the results and optical parameters of the SXT mirror such as reflectivity, and roughness calculated from the measurements.

Original languageEnglish
Title of host publicationSpace Telescopes and Instrumentation 2012
Subtitle of host publicationUltraviolet to Gamma Ray
DOIs
Publication statusPublished - 2012
Externally publishedYes
EventSpace Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray - Amsterdam, Netherlands
Duration: 01-07-201206-07-2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8443
ISSN (Print)0277-786X

Other

OtherSpace Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray
CountryNetherlands
CityAmsterdam
Period01-07-1206-07-12

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Sugita, S., Furuzawa, A., Ishibashi, K., Tamura, K., Okajima, T., Maeda, Y., Sato, T., Ichihara, K., Tomikawa, K., Iizuka, R., Awaya, T., & Okada, K. (2012). Measurement of re ectivity of X-ray mirror for soft x-ray telescope onboard ASTRO-H. In Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray [844358] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8443). https://doi.org/10.1117/12.926711