Verification of pin-photo diode detector characteristics using EGS5

S. Kondo, T. Haba, D. Hayashi, H. Numamoto, T. Ishii, S. Koyama

Research output: Contribution to conferencePaper

Abstract

We developed a novel X-ray beam analyzing system with eight sensors using commercially available pin silicon photodiodes to estimate the effective energy and intensity of incident X-ray in each angle undergoing computerized tomography (CT). The aim of this study was to verify characteristics of photodiodes of X-ray beam analyzing system in a diagnostic energy region using Electron Gamma Shower ver.5 (EGS5). X-ray energy and angular dependence were assessed for the X-ray beam analyzing system by irradiating one of eight sensors, and which were also calculated by EGS5 under the same conditions as those considered during the measurement. Measurement results is that the output value of photodiode was correlated with any effective energy of incident X-rays, which suggested that when a sensor in the X-ray beam analyzing system is irradiated, the system can estimate the effective energy of the incident X-rays. X-ray energy and angular dependence calculated by EGS5 are in good agreement with measurement, which can be helpful in further experiments. In this study, the characteristics of photodiodes of X-ray beam analyzing system were obtained through measurement experiment, and were verified by EGS5. X-ray beam analyzing system can accurately estimate the effective energy of any incident X-rays which has any maximum energy and the shape of X-ray energy spectra.

Original languageEnglish
Pages16-20
Number of pages5
Publication statusPublished - 2012
Event19th EGS Users' Meeting in Japan 2012 - Tsukuba, Japan
Duration: 01-08-201203-08-2012

Conference

Conference19th EGS Users' Meeting in Japan 2012
CountryJapan
CityTsukuba
Period01-08-1203-08-12

All Science Journal Classification (ASJC) codes

  • Software

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    Kondo, S., Haba, T., Hayashi, D., Numamoto, H., Ishii, T., & Koyama, S. (2012). Verification of pin-photo diode detector characteristics using EGS5. 16-20. Paper presented at 19th EGS Users' Meeting in Japan 2012, Tsukuba, Japan.