Angular resolution measurements at SPring-8 of a hard X-ray optic for the new hard X-ray mission

  • D. Spiga
  • , L. Raimondi
  • , A. Furuzawa
  • , S. Basso
  • , R. Binda
  • , G. Borghi
  • , V. Cotroneo
  • , G. Grisoni
  • , H. Kunieda
  • , F. Marioni
  • , H. Matsumoto
  • , H. Mori
  • , T. Miyazawa
  • , B. Negri
  • , A. Orlandi
  • , G. Pareschi
  • , B. Salmaso
  • , G. Tagliaferri
  • , K. Uesugi
  • , G. Valsecchi
  • D. Vernani

研究成果: 書籍/レポート タイプへの寄稿会議への寄与

11   !!Link opens in a new tab 被引用数 (Scopus)

抄録

The realization of X-ray telescopes with imaging capabilities in the hard (> 10 keV) X-ray band requires the adoption of optics with shallow (< 0.25 deg) grazing angles to enhance the reflectivity of reflective coatings. On the other hand, to obtain large collecting area, large mirror diameters (< 350 mm) are necessary. This implies that mirrors with focal lengths ≥10 m shall be produced and tested. Full-illumination tests of such mirrors are usually performed with onground X-ray facilities, aimed at measuring their effective area and the angular resolution; however, they in general suffer from effects of the finite distance of the X-ray source, e.g. a loss of effective area for double reflection. These effects increase with the focal length of the mirror under test; hence a "partial" full-illumination measurement might not be fully representative of the in-flight performances. Indeed, a pencil beam test can be adopted to overcome this shortcoming, because a sector at a time is exposed to the X-ray flux, and the compensation of the beam divergence is achieved by tilting the optic. In this work we present the result of a hard X-ray test campaign performed at the BL20B2 beamline of the SPring-8 synchrotron radiation facility, aimed at characterizing the Point Spread Function (PSF) of a multilayer-coated Wolter-I mirror shell manufactured by Nickel electroforming. The mirror shell is a demonstrator for the NHXM hard X-ray imaging telescope (0.3 - 80 keV), with a predicted HEW (Half Energy Width) close to 20 arcsec. We show some reconstructed PSFs at monochromatic X-ray energies of 15 to 63 keV, and compare them with the PSFs computed from post-campaign metrology data, self-consistently treating profile and roughness data by means of a method based on the Fresnel diffraction theory. The modeling matches the measured PSFs accurately.

本文言語英語
ホスト出版物のタイトルOptics for EUV, X-Ray, and Gamma-Ray Astronomy V
DOI
出版ステータス出版済み - 2011
外部発表はい
イベントOptics for EUV, X-Ray, and Gamma-Ray Astronomy V - San Diego, CA, 米国
継続期間: 23-08-201125-08-2011

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
8147
ISSN(印刷版)0277-786X

その他

その他Optics for EUV, X-Ray, and Gamma-Ray Astronomy V
国/地域米国
CitySan Diego, CA
Period23-08-1125-08-11

All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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