抄録
Deep isolation trenches with high aspect ratio were formed on CdTe crystals using the excimer laser etching technique. Vertical trenches 80-μm deep and 55-μm wide were formed in 5 min by irradiating a laser on the CdTe crystal through a contact-type metal mask in vacuum. Surface chemistry of the laser-irradiated CdTe crystal was examined by Auger electron spectroscopy (AES), scanning electron microscopy (SEM), and photoluminescence (PL) to determine the extent of laser-induced damage. It was found that the damaged layer remains confined to the thin surface layer in the submicron range, which could be easily removed by a light Br-methanol etch.
| 本文言語 | 英語 |
|---|---|
| ページ(範囲) | 837-840 |
| ページ数 | 4 |
| ジャーナル | Journal of Electronic Materials |
| 巻 | 36 |
| 号 | 8 |
| DOI | |
| 出版ステータス | 出版済み - 08-2007 |
| 外部発表 | はい |
All Science Journal Classification (ASJC) codes
- 電子材料、光学材料、および磁性材料
- 凝縮系物理学
- 電子工学および電気工学
- 材料化学
フィンガープリント
「Excimer laser etching process of CdTe crystals for formation of deep vertical trenches」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。引用スタイル
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver