Measurement of re ectivity of X-ray mirror for soft x-ray telescope onboard ASTRO-H

Satoshi Sugita, Akihiro Furuzawa, Kazunori Ishibashi, Keisuke Tamura, Takashi Okajima, Yoshitomo Maeda, Takuro Sato, Kou Ichihara, Kazuki Tomikawa, Ryo Iizuka, Takashi Awaya, Kohta Okada

研究成果: Conference contribution

1 被引用数 (Scopus)


X-ray reflection mirror of the Soft X-ray Telescope onboard ASTRO-H was coated by gold thin layer. Gold have M-shell X-ray absorption edge around 2 keV which is included in the energy band covered with the focal plane detector such as Soft X-ray Imager and Soft X-ray Spectrometer. It is important to make response function taken int account the Au M-dege structure especially for the Soft X-ray Spectrometer because It has unprecedented high energy resolution of 5 eV from 0.3 to 12 keV. We performed the detailed measurements of of reflectivity of the mirror using reflectometer in the synchrotron radiation facility KEK PF BL-11B from Nov. 29, 2011 to Dec. 5. X-ray beam of BL-11B was monochromatized to E/deltaE of 5000 by Double crystal monochromator using Si(111). We obtained the reflectivity at the grazing incident angles of 1.0, 1.2, and 1.4 degrees. While the energy pitch was set to be 2 eV in the 2.1-4.1 keV band, the reflectivity in the 2.2-2.35 keV band was also measured in detail with the energy pitch of 0.25 eV. We report the results and optical parameters of the SXT mirror such as reflectivity, and roughness calculated from the measurements.

ホスト出版物のタイトルSpace Telescopes and Instrumentation 2012
ホスト出版物のサブタイトルUltraviolet to Gamma Ray
出版ステータスPublished - 2012
イベントSpace Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray - Amsterdam, Netherlands
継続期間: 01-07-201206-07-2012


名前Proceedings of SPIE - The International Society for Optical Engineering


OtherSpace Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray

All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学


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